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Mots clés
Passivation
Evaluation
Oxidation
X-ray diffraction
Auger electron spectroscopy AES
HfO2
Density functional theory
2H
Annealing
Ageing
Topological defects
Channeling
Acoustic propreties of solid
6855Jk
Rutherford backscattering spectrometry RBS
AFM
7630Lh
Gallium oxide
EPR
Capillary condensation
13C
Multilayer
Ferromagnetic resonance
Aluminium
GaMnAs
Silica
Transparent conductive oxide TCO
XRD
Measurement
27Alda
Raman spectroscopy
Growth
Nickel
Magnetic semiconductors
Interface defects
Pulsed laser deposition
Zinc oxide
Pb centers
Magnetization curves
ADSORPTION DESORPTION HYSTERESIS
Topological insulators
Adsorbed layers
Atomic Layer Deposition ALD
Silicon Carbide
Periodic multilayer
Defects
Diffusion
Energy loss
8140Ef
Charge exchange
Adsorption
Epitaxial growth
PIXE
Magnetic anisotropy
Thin films
3C-SiC
17O
AC susceptibility
27Aldp
Metal-insulator transition
Ion beam analysis
Nitridation
Epitaxy
Sputtering
NRP
Nuclear resonance profiling NRP
SiC
Kossel diffraction
Silicon
NRA
Stable isotopic tracing
18O resonance
Ion implantation
7550Pp
Al2O3
Adsorption Isotherms
Hysteresis
RBS
Nanoparticles
ALD
Thin film
17Op
Photoluminescence
27Ald p&α
Low energy electron diffraction LEED
17Opp
Gold
Oxygen deficiency
Aluminum
Acoustic
Isotopic Tracing
7550Ee
Nanostructures
Alloys
Nuclear reaction analysis
XPS
18O
Indium oxide
Silicon carbide
15N