index - PCM Accéder directement au contenu

Derniers dépôts

Chargement de la page

Rechercher

Nombre de documents

77

Nombre de notices

277

Mots-clés

Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation B Chemical synthesis Carbon Etching Adsorption CaTiO3Pr^3^+ Chemical and biological sensors Biocapteurs X-ray photoelectron spectroscopy CIGSe Chalcogenide glass V2O3 Films Plasmas froids Kirkendall effect Calcined clay CH4 Magnetron sputtering AuCu alloy Bipolar resistive switching BRS Band alignment Resistive switching TiO2 Ambipolar material Chalcogenides A Chalcogenides B1 Inorganic compounds Copper SF 6 Transmission electron microscopy CNTs’ collapse Alzheimer's disease Alloying Thin film X-ray diffraction Mott insulator BOMBARDMENT Biomasse A Multilayers Colloidal solution Avalanche breakdown NEXAFS Chalcogenide B2 Quaternary Biofilms microbiens Titanium dioxide Carbon nanotubes Transfert d'énergie Carbon Nanotube Oxides Semiconductors Capacitance Selenization A-CNx Aryl-diazonium salts CHLORINE PLASMAS B2 Semiconducting alloys Amyloid precursor Non-volatile memory Buffer Couple Sol-gel Applications industrielles Amorphous XPS Anatase AlN Low-pressure plasma processing Thin films AZO thin films C Photoelectron spectroscopy B2 Semiconducting indium compounds Scanning electron microscopy A1 Characterization Atomic force microscopy Bixbyite Nanocomposite Band gap Cathepsin Sputtering Physical vapor deposition Vanadium Sesquioxide Atomic layer etching Plasma etching A3 Physical vapor deposition processes Nanotubes A Thin films 3 nm in size Aluminium nitride Structure B3 Solar cells Chemical detection Carbon nitride Mott insulators PECVD Spectroscopic ellipsometry Functionalization Residual stress Optical properties TEM Ablation laser